dc.contributor.author | Unutulmaz, Ahmet | |
dc.contributor.author | Helms, Domenik | |
dc.contributor.author | Eilers, Reef | |
dc.contributor.author | Metzdorf, Malte | |
dc.contributor.author | Kaczer, Ben | |
dc.contributor.author | Nebel, Wolfgang | |
dc.date.accessioned | 2021-10-23T15:44:47Z | |
dc.date.available | 2021-10-23T15:44:47Z | |
dc.date.issued | 2016 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/27416 | |
dc.source | IIOimport | |
dc.title | Analysis of NBTI effects on high frequency digital circuits | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Kaczer, Ben | |
dc.contributor.orcidimec | Kaczer, Ben::0000-0002-1484-4007 | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 223 | |
dc.source.endpage | 228 | |
dc.source.conference | Design, Automation & Test in Europe Conference & Exhibition - DATE | |
dc.source.conferencedate | 14/03/2016 | |
dc.source.conferencelocation | Dresden Germany | |
dc.identifier.url | http://ieeexplore.ieee.org/document/7459308/ | |
imec.availability | Published - open access | |