Show simple item record

dc.contributor.authorUnutulmaz, Ahmet
dc.contributor.authorHelms, Domenik
dc.contributor.authorEilers, Reef
dc.contributor.authorMetzdorf, Malte
dc.contributor.authorKaczer, Ben
dc.contributor.authorNebel, Wolfgang
dc.date.accessioned2021-10-23T15:44:47Z
dc.date.available2021-10-23T15:44:47Z
dc.date.issued2016
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/27416
dc.sourceIIOimport
dc.titleAnalysis of NBTI effects on high frequency digital circuits
dc.typeProceedings paper
dc.contributor.imecauthorKaczer, Ben
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage223
dc.source.endpage228
dc.source.conferenceDesign, Automation & Test in Europe Conference & Exhibition - DATE
dc.source.conferencedate14/03/2016
dc.source.conferencelocationDresden Germany
dc.identifier.urlhttp://ieeexplore.ieee.org/document/7459308/
imec.availabilityPublished - open access


Files in this item

Thumbnail

This item appears in the following collection(s)

Show simple item record