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Assessment of oxide reliability and hot carrier degradation in CMOS technology

dc.contributor.authorMaes, Herman
dc.contributor.authorGroeseneken, Guido
dc.contributor.authorDegraeve, Robin
dc.contributor.authorDe Blauwe, Jan
dc.contributor.authorVan den Bosch, Geert
dc.date.accessioned2021-10-01T08:29:27Z
dc.date.available2021-10-01T08:29:27Z
dc.date.issued1998
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/2747
dc.sourceIIOimport
dc.titleAssessment of oxide reliability and hot carrier degradation in CMOS technology
dc.typeJournal article
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.imecauthorDegraeve, Robin
dc.contributor.imecauthorVan den Bosch, Geert
dc.contributor.orcidimecVan den Bosch, Geert::0000-0001-9971-6954
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage147
dc.source.endpage166
dc.source.journalMicroelectronic Engineering
dc.source.volume40
imec.availabilityPublished - open access


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