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3.8 μm heterogeneously integrated III-V on silicon micro-spectrometer

dc.contributor.authorVasiliev, Anton
dc.contributor.authorMuneeb, Muhammad
dc.contributor.authorRuocco, Alfonso
dc.contributor.authorMalik, Aditya Singh
dc.contributor.authorChen, Hongtao
dc.contributor.authorNedeljkovic, Milos
dc.contributor.authorSoler-Penades, Jordi
dc.contributor.authorCerutti, Laurent
dc.contributor.authorRodriguez, J.B.
dc.contributor.authorMashanovich, G.
dc.contributor.authorSmit, M.
dc.contributor.authorTournie, E.
dc.contributor.authorRoelkens, Gunther
dc.date.accessioned2021-10-23T16:26:53Z
dc.date.available2021-10-23T16:26:53Z
dc.date.issued2016
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/27504
dc.sourceIIOimport
dc.title3.8 μm heterogeneously integrated III-V on silicon micro-spectrometer
dc.typeProceedings paper
dc.contributor.imecauthorVasiliev, Anton
dc.contributor.imecauthorMuneeb, Muhammad
dc.contributor.imecauthorRoelkens, Gunther
dc.contributor.orcidimecRoelkens, Gunther::0000-0002-4667-5092
dc.contributor.orcidimecVasiliev, Anton::0000-0002-7712-2183
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpageECIO/p-24
dc.source.conference18th European Conference in Integrated Optics - ECIO
dc.source.conferencedate18/05/2016
dc.source.conferencelocationWarsaw Poland
imec.availabilityPublished - imec


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