Publication:

Gate-all-around nanowire FETs vs. triple-gate FinFETs: on gate integrity and device characteristics

Date

Loading...
Thumbnail Image

Abstract

Description

Statistics

Views

1942 since deposited on 2021-10-23
Acq. date: 2026-02-25

Citations

Statistics

Views

1942 since deposited on 2021-10-23
Acq. date: 2026-02-25

Citations