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Effective hole mobility and low-frequency noise characterization of strained Ge pFinFETs

dc.contributor.authorVinicius de Oliveira, Alberto
dc.contributor.authorSimoen, Eddy
dc.contributor.authorGhedini Der Agopian, Paula
dc.contributor.authorMartino, Joao Antonio
dc.contributor.authorMitard, Jerome
dc.contributor.authorWitters, Liesbeth
dc.contributor.authorLanger, Robert
dc.contributor.authorCollaert, Nadine
dc.contributor.authorClaeys, Cor
dc.contributor.authorThean, Aaron
dc.date.accessioned2021-10-23T16:53:46Z
dc.date.available2021-10-23T16:53:46Z
dc.date.issued2016
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/27554
dc.sourceIIOimport
dc.titleEffective hole mobility and low-frequency noise characterization of strained Ge pFinFETs
dc.typeProceedings paper
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.imecauthorMitard, Jerome
dc.contributor.imecauthorWitters, Liesbeth
dc.contributor.imecauthorLanger, Robert
dc.contributor.imecauthorCollaert, Nadine
dc.contributor.imecauthorThean, Aaron
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.contributor.orcidimecMitard, Jerome::0000-0002-7422-079X
dc.contributor.orcidimecLanger, Robert::0000-0002-1132-3468
dc.contributor.orcidimecCollaert, Nadine::0000-0002-8062-3165
dc.source.peerreviewyes
dc.source.conferenceJoint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon - ULIS
dc.source.conferencedate25/01/2016
dc.source.conferencelocationWien Austria
imec.availabilityPublished - imec


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