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Multiport measurements

dc.contributor.authorMartens, Luc
dc.contributor.authorSercu, Stefaan
dc.date.accessioned2021-10-01T08:29:53Z
dc.date.available2021-10-01T08:29:53Z
dc.date.issued1998
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/2757
dc.sourceIIOimport
dc.titleMultiport measurements
dc.typeProceedings paper
dc.contributor.imecauthorMartens, Luc
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage66
dc.source.endpage75
dc.source.conferenceIEEE MTT-S Int. Microwave Symposium. CAD, EM Modeling and Measurement for Electronics Packaging and Interconnects Workshop
dc.source.conferencedate8/06/1998
dc.source.conferencelocationBaltimore, MD USA
imec.availabilityPublished - open access


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