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Reliable 50Gb/s silicon photonics platform for next-generation data center optical interconnects

dc.contributor.authorAbsil, Philippe
dc.contributor.authorCroes, Kristof
dc.contributor.authorDe Heyn, Peter
dc.contributor.authorBan, Yoojin
dc.contributor.authorSnyder, Brad
dc.contributor.authorDe Coster, Jeroen
dc.contributor.authorBalakrishnan, Sadhishkumar
dc.contributor.authorLepage, Guy
dc.contributor.authorGolshani, Negin
dc.contributor.authorVerheyen, Peter
dc.contributor.authorPantouvaki, Marianna
dc.contributor.authorVan Campenhout, Joris
dc.contributor.authorFodor, Ferenc
dc.contributor.authorLesniewska, Alicja
dc.contributor.authorSimons, Veerle
dc.contributor.authorLardenois, Sebastien
dc.contributor.authorDetalle, Mikael
dc.contributor.authorChen, Hongtao
dc.contributor.authorMiller, Andy
dc.contributor.authorLoo, Roger
dc.contributor.authorVanherle, Wendy
dc.date.accessioned2021-10-24T02:51:02Z
dc.date.available2021-10-24T02:51:02Z
dc.date.issued2017
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/27708
dc.sourceIIOimport
dc.titleReliable 50Gb/s silicon photonics platform for next-generation data center optical interconnects
dc.typeProceedings paper
dc.contributor.imecauthorAbsil, Philippe
dc.contributor.imecauthorCroes, Kristof
dc.contributor.imecauthorDe Heyn, Peter
dc.contributor.imecauthorBan, Yoojin
dc.contributor.imecauthorDe Coster, Jeroen
dc.contributor.imecauthorBalakrishnan, Sadhishkumar
dc.contributor.imecauthorLepage, Guy
dc.contributor.imecauthorGolshani, Negin
dc.contributor.imecauthorVerheyen, Peter
dc.contributor.imecauthorPantouvaki, Marianna
dc.contributor.imecauthorVan Campenhout, Joris
dc.contributor.imecauthorFodor, Ferenc
dc.contributor.imecauthorLesniewska, Alicja
dc.contributor.imecauthorSimons, Veerle
dc.contributor.imecauthorLardenois, Sebastien
dc.contributor.imecauthorDetalle, Mikael
dc.contributor.imecauthorMiller, Andy
dc.contributor.imecauthorLoo, Roger
dc.contributor.imecauthorVanherle, Wendy
dc.contributor.orcidimecCroes, Kristof::0000-0002-3955-0638
dc.contributor.orcidimecDe Heyn, Peter::0000-0003-3523-7377
dc.contributor.orcidimecVan Campenhout, Joris::0000-0003-0778-2669
dc.contributor.orcidimecLesniewska, Alicja::0000-0003-3863-065X
dc.contributor.orcidimecSimons, Veerle::0000-0001-5714-955X
dc.contributor.orcidimecLoo, Roger::0000-0003-3513-6058
dc.source.peerreviewyes
dc.source.beginpage761
dc.source.endpage764
dc.source.conferenceIEEE International Electron Devices Meeting - IEDM
dc.source.conferencedate2/12/2017
dc.source.conferencelocationSan Francisco, CA USA
imec.availabilityPublished - imec


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