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Estimation of sense amplifier offset voltage degradation due to zero- and run-time variability

dc.contributor.authorAgbo, Innocent
dc.contributor.authorTaouil, Motta
dc.contributor.authorKraak, Daniel
dc.contributor.authorHamdioui, Said
dc.contributor.authorKukner, Halil
dc.contributor.authorWeckx, Pieter
dc.contributor.authorRaghavan, Praveen
dc.contributor.authorCatthoor, Francky
dc.date.accessioned2021-10-24T02:51:23Z
dc.date.available2021-10-24T02:51:23Z
dc.date.issued2017
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/27722
dc.sourceIIOimport
dc.titleEstimation of sense amplifier offset voltage degradation due to zero- and run-time variability
dc.typeOral presentation
dc.contributor.imecauthorWeckx, Pieter
dc.contributor.imecauthorCatthoor, Francky
dc.contributor.orcidimecCatthoor, Francky::0000-0002-3599-8515
dc.source.peerreviewno
dc.source.conferenceICT Open Workshop
dc.source.conferencedate21/03/2017
dc.source.conferencelocationAmersfoort The Netherlands
imec.availabilityPublished - imec


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