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Transistors on two-dimensional semiconductors: contact resistance limited by the contact edges

dc.contributor.authorArutchelvan, Goutham
dc.contributor.authorMatagne, Philippe
dc.contributor.authorLockhart de la Rosa, Cesar Javier
dc.contributor.authorSutar, Surajit
dc.contributor.authorDe Gendt, Stefan
dc.contributor.authorHeyns, Marc
dc.contributor.authorRadu, Iuliana
dc.date.accessioned2021-10-24T02:53:21Z
dc.date.available2021-10-24T02:53:21Z
dc.date.issued2017
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/27768
dc.sourceIIOimport
dc.titleTransistors on two-dimensional semiconductors: contact resistance limited by the contact edges
dc.typeProceedings paper
dc.contributor.imecauthorArutchelvan, Goutham
dc.contributor.imecauthorMatagne, Philippe
dc.contributor.imecauthorLockhart de la Rosa, Cesar Javier
dc.contributor.imecauthorSutar, Surajit
dc.contributor.imecauthorDe Gendt, Stefan
dc.contributor.imecauthorHeyns, Marc
dc.contributor.imecauthorRadu, Iuliana
dc.contributor.orcidimecDe Gendt, Stefan::0000-0003-3775-3578
dc.contributor.orcidimecRadu, Iuliana::0000-0002-7230-7218
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage1
dc.source.endpage3
dc.source.conferenceIEEE International Interconnect Technology Conference - IITC
dc.source.conferencedate16/05/2017
dc.source.conferencelocationHsinchu Taiwan
dc.identifier.urlhttp://ieeexplore.ieee.org/document/7968951/
imec.availabilityPublished - open access


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