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Impact of the electronic band structure on the reliability of triple Layer a-VMCO devices

dc.contributor.authorBelmonte, Attilio
dc.contributor.authorGovoreanu, Bogdan
dc.contributor.authorSubirats, Alexandre
dc.contributor.authorDi Piazza, Luca
dc.contributor.authorGoux, Ludovic
dc.contributor.authorKar, Gouri Sankar
dc.date.accessioned2021-10-24T02:57:23Z
dc.date.available2021-10-24T02:57:23Z
dc.date.issued2017
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/27825
dc.sourceIIOimport
dc.titleImpact of the electronic band structure on the reliability of triple Layer a-VMCO devices
dc.typeProceedings paper
dc.contributor.imecauthorBelmonte, Attilio
dc.contributor.imecauthorGovoreanu, Bogdan
dc.contributor.imecauthorDi Piazza, Luca
dc.contributor.imecauthorGoux, Ludovic
dc.contributor.imecauthorKar, Gouri Sankar
dc.contributor.orcidimecGoux, Ludovic::0000-0002-1276-2278
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpagePM-10.1
dc.source.endpagePM-10.5
dc.source.conferenceIEEE International Reliability Physics Symposium - IRPS
dc.source.conferencedate2/04/2017
dc.source.conferencelocationMonterey, CA USA
dc.identifier.urlhttp://ieeexplore.ieee.org/document/7936392/
imec.availabilityPublished - open access


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