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X-ray absorption correction in pillar shaped samples

dc.contributor.authorBender, Hugo
dc.contributor.authorSeidel, Felix
dc.contributor.authorFavia, Paola
dc.contributor.authorRichard, Olivier
dc.date.accessioned2021-10-24T02:58:13Z
dc.date.available2021-10-24T02:58:13Z
dc.date.issued2017
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/27834
dc.sourceIIOimport
dc.titleX-ray absorption correction in pillar shaped samples
dc.typeOral presentation
dc.contributor.imecauthorBender, Hugo
dc.contributor.imecauthorSeidel, Felix
dc.contributor.imecauthorFavia, Paola
dc.contributor.imecauthorRichard, Olivier
dc.contributor.orcidimecFavia, Paola::0000-0002-1019-3497
dc.contributor.orcidimecRichard, Olivier::0000-0002-3994-8021
dc.source.peerreviewno
dc.source.conferenceMicroscopy of Semiconducting Materials XX - MSM
dc.source.conferencedate9/04/2017
dc.source.conferencelocationOxford United Kingdom
imec.availabilityPublished - imec


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