Direct correlation between low-frequency noise measurements and electromigration lifetimes

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Authors
Beyne, Sofie; Croes, Kristof; De Wolf, Ingrid; Tokei, Zsolt
Conference
IEEE International Reliability Physics Symposium - IRPS
Title
Direct correlation between low-frequency noise measurements and electromigration lifetimes
Publication type
Proceedings paper
Embargo date
9999-12-31
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