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Calibration of the high-doping induced ballistic band-tails tunneling current in In0.53Ga0.47As Esaki diodes

dc.contributor.authorBizindavyi, Jasper
dc.contributor.authorVerhulst, Anne
dc.contributor.authorSmets, Quentin
dc.contributor.authorVerreck, Devin
dc.contributor.authorCollaert, Nadine
dc.contributor.authorMocuta, Anda
dc.contributor.authorSoree, Bart
dc.contributor.authorGroeseneken, Guido
dc.date.accessioned2021-10-24T03:00:36Z
dc.date.available2021-10-24T03:00:36Z
dc.date.issued2017
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/27858
dc.sourceIIOimport
dc.titleCalibration of the high-doping induced ballistic band-tails tunneling current in In0.53Ga0.47As Esaki diodes
dc.typeProceedings paper
dc.contributor.imecauthorBizindavyi, Jasper
dc.contributor.imecauthorVerhulst, Anne
dc.contributor.imecauthorSmets, Quentin
dc.contributor.imecauthorVerreck, Devin
dc.contributor.imecauthorCollaert, Nadine
dc.contributor.imecauthorSoree, Bart
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.orcidimecBizindavyi, Jasper::0000-0002-2213-9017
dc.contributor.orcidimecVerhulst, Anne::0000-0002-3742-9017
dc.contributor.orcidimecSmets, Quentin::0000-0002-2356-5915
dc.contributor.orcidimecVerreck, Devin::0000-0002-3833-5880
dc.contributor.orcidimecCollaert, Nadine::0000-0002-8062-3165
dc.contributor.orcidimecSoree, Bart::0000-0002-4157-1956
dc.contributor.orcidimecGroeseneken, Guido::0000-0003-3763-2098
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage1
dc.source.endpage3
dc.source.conferenceFifth Berkeley Symposium on Energy Efficient Electronic Systems and Steep Transistors Workshop
dc.source.conferencedate19/10/2017
dc.source.conferencelocationBerkeley, CA USA
dc.identifier.urlhttp://ieeexplore.ieee.org/document/8246161
imec.availabilityPublished - open access


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