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Monte Carlo benchmark of In0.53Ga0.47As- and silicon-FinFETs

dc.contributor.authorBufler, Fabian
dc.contributor.authorEneman, Geert
dc.contributor.authorCollaert, Nadine
dc.contributor.authorMocuta, Anda
dc.date.accessioned2021-10-24T03:11:46Z
dc.date.available2021-10-24T03:11:46Z
dc.date.issued2017
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/27940
dc.sourceIIOimport
dc.titleMonte Carlo benchmark of In0.53Ga0.47As- and silicon-FinFETs
dc.typeProceedings paper
dc.contributor.imecauthorBufler, Fabian
dc.contributor.imecauthorEneman, Geert
dc.contributor.imecauthorCollaert, Nadine
dc.contributor.orcidimecBufler, Fabian::0000-0002-1558-9378
dc.contributor.orcidimecEneman, Geert::0000-0002-5849-3384
dc.contributor.orcidimecCollaert, Nadine::0000-0002-8062-3165
dc.source.peerreviewyes
dc.source.beginpage318
dc.source.endpage321
dc.source.conferenceIEEE International Electron Devices Meeting - IEDM
dc.source.conferencedate2/12/2017
dc.source.conferencelocationSan Francisco, CA USA
dc.identifier.urlhttp://ieeexplore.ieee.org/document/8268383/
imec.availabilityPublished - imec


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