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On the ballistic ratio in 14nm-node FinFETs

dc.contributor.authorBufler, Fabian
dc.contributor.authorMiyaguchi, Kenichi
dc.contributor.authorChiarella, Thomas
dc.contributor.authorHoriguchi, Naoto
dc.contributor.authorMocuta, Anda
dc.date.accessioned2021-10-24T03:11:55Z
dc.date.available2021-10-24T03:11:55Z
dc.date.issued2017
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/27941
dc.sourceIIOimport
dc.titleOn the ballistic ratio in 14nm-node FinFETs
dc.typeProceedings paper
dc.contributor.imecauthorBufler, Fabian
dc.contributor.imecauthorMiyaguchi, Kenichi
dc.contributor.imecauthorChiarella, Thomas
dc.contributor.imecauthorHoriguchi, Naoto
dc.contributor.orcidimecBufler, Fabian::0000-0002-1558-9378
dc.contributor.orcidimecMiyaguchi, Kenichi::0000-0002-7073-6457
dc.contributor.orcidimecChiarella, Thomas::0000-0002-6155-9030
dc.contributor.orcidimecHoriguchi, Naoto::0000-0001-5490-0416
dc.source.peerreviewyes
dc.source.beginpage176
dc.source.endpage179
dc.source.conference47th European Solid-State Device Research Conference - ESSDERC
dc.source.conferencedate11/09/2017
dc.source.conferencelocationLeuven Belgium
dc.identifier.urlhttp://ieeexplore.ieee.org/document/8066620/
imec.availabilityPublished - imec


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