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Low temperature performance of proton irradiated strained SOI FinFET

dc.contributor.authorCaparroz, L.F.V.
dc.contributor.authorBordallo, C.C.M.
dc.contributor.authorMartino, J.A.
dc.contributor.authorSimoen, Eddy
dc.contributor.authorClaeys, Cor
dc.contributor.authorAgopian, P.G.D.
dc.date.accessioned2021-10-24T03:15:18Z
dc.date.available2021-10-24T03:15:18Z
dc.date.issued2017
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/27963
dc.sourceIIOimport
dc.titleLow temperature performance of proton irradiated strained SOI FinFET
dc.typeProceedings paper
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.source.peerreviewyes
dc.source.beginpage1
dc.source.endpage3
dc.source.conferenceJoint International EUSOSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS)
dc.source.conferencedate3/04/2017
dc.source.conferencelocationAthens Greece
dc.identifier.urlhttps://ieeexplore.ieee.org/abstract/document/7962601/
imec.availabilityPublished - imec


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