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Non-filamentary (VMCO) memory: a two- and three-dimensional study on switching and failure modes

dc.contributor.authorCelano, Umberto
dc.contributor.authorGastaldi, Carlotta
dc.contributor.authorSubhechha, Subhali
dc.contributor.authorGovoreanu, Bogdan
dc.contributor.authorDonadio, Gabriele Luca
dc.contributor.authorFranquet, Alexis
dc.contributor.authorAhmad, Tareq
dc.contributor.authorDetavernier, Christophe
dc.contributor.authorRichard, Olivier
dc.contributor.authorBender, Hugo
dc.contributor.authorGoux, Ludovic
dc.contributor.authorKar, Gouri Sankar
dc.contributor.authorvan der Heide, Paul
dc.contributor.authorVandervorst, Wilfried
dc.date.accessioned2021-10-24T03:20:50Z
dc.date.available2021-10-24T03:20:50Z
dc.date.issued2017
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/27989
dc.sourceIIOimport
dc.titleNon-filamentary (VMCO) memory: a two- and three-dimensional study on switching and failure modes
dc.typeProceedings paper
dc.contributor.imecauthorCelano, Umberto
dc.contributor.imecauthorSubhechha, Subhali
dc.contributor.imecauthorGovoreanu, Bogdan
dc.contributor.imecauthorDonadio, Gabriele Luca
dc.contributor.imecauthorFranquet, Alexis
dc.contributor.imecauthorRichard, Olivier
dc.contributor.imecauthorBender, Hugo
dc.contributor.imecauthorGoux, Ludovic
dc.contributor.imecauthorKar, Gouri Sankar
dc.contributor.imecauthorvan der Heide, Paul
dc.contributor.imecauthorVandervorst, Wilfried
dc.contributor.orcidimecCelano, Umberto::0000-0002-2856-3847
dc.contributor.orcidimecFranquet, Alexis::0000-0002-7371-8852
dc.contributor.orcidimecRichard, Olivier::0000-0002-3994-8021
dc.contributor.orcidimecGoux, Ludovic::0000-0002-1276-2278
dc.contributor.orcidimecvan der Heide, Paul::0000-0001-6292-0329
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage860
dc.source.endpage863
dc.source.conferenceIEEE International Electron Devices Meeting - IEDM
dc.source.conferencedate2/12/2017
dc.source.conferencelocationSan Francisco, CA USA
dc.identifier.urlhttp://ieeexplore.ieee.org/document/8268519/
imec.availabilityPublished - open access


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