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Electrical atomic force microscopy for 2D transition metal dichalcogenide materials

dc.contributor.authorCelano, Umberto
dc.contributor.authorVirkki, Olli
dc.contributor.authorMascaro, Marco
dc.contributor.authorNalin Mehta, Ankit
dc.contributor.authorBender, Hugo
dc.contributor.authorChiappe, Daniele
dc.contributor.authorAsselberghs, Inge
dc.contributor.authorParedis, Kristof
dc.contributor.authorHoflijk, Ilse
dc.contributor.authorFranquet, Alexis
dc.contributor.authorHuyghebaert, Cedric
dc.contributor.authorRadu, Iuliana
dc.contributor.authorVandervorst, Wilfried
dc.date.accessioned2021-10-24T03:21:47Z
dc.date.available2021-10-24T03:21:47Z
dc.date.issued2017
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/27994
dc.sourceIIOimport
dc.titleElectrical atomic force microscopy for 2D transition metal dichalcogenide materials
dc.typeProceedings paper
dc.contributor.imecauthorCelano, Umberto
dc.contributor.imecauthorMascaro, Marco
dc.contributor.imecauthorNalin Mehta, Ankit
dc.contributor.imecauthorBender, Hugo
dc.contributor.imecauthorAsselberghs, Inge
dc.contributor.imecauthorParedis, Kristof
dc.contributor.imecauthorHoflijk, Ilse
dc.contributor.imecauthorFranquet, Alexis
dc.contributor.imecauthorHuyghebaert, Cedric
dc.contributor.imecauthorRadu, Iuliana
dc.contributor.imecauthorVandervorst, Wilfried
dc.contributor.orcidimecCelano, Umberto::0000-0002-2856-3847
dc.contributor.orcidimecNalin Mehta, Ankit::0000-0002-2169-940X
dc.contributor.orcidimecParedis, Kristof::0000-0002-5163-4164
dc.contributor.orcidimecFranquet, Alexis::0000-0002-7371-8852
dc.contributor.orcidimecHuyghebaert, Cedric::0000-0001-6043-7130
dc.contributor.orcidimecRadu, Iuliana::0000-0002-7230-7218
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage41
dc.source.endpage47
dc.source.conferenceEmerging Materials for Post CMOS Devices/Sensing and Applications 8
dc.source.conferencedate28/05/2017
dc.source.conferencelocationNew Orleans, LA USA
dc.identifier.urlhttp://ecst.ecsdl.org/content/77/2/41.abstract
imec.availabilityPublished - open access
imec.internalnotesECS Transactions; Vol. 77, Issue 2


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