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On the degradation of 1-MeV electron irradiated Si1-xGex diodes

dc.contributor.authorOhyama, Hidenori
dc.contributor.authorVanhellemont, Jan
dc.contributor.authorSunaga, H.
dc.contributor.authorPoortmans, Jef
dc.contributor.authorCaymax, Matty
dc.contributor.authorClauws, P.
dc.date.accessioned2021-09-29T12:44:45Z
dc.date.available2021-09-29T12:44:45Z
dc.date.issued1994
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/279
dc.sourceIIOimport
dc.titleOn the degradation of 1-MeV electron irradiated Si1-xGex diodes
dc.typeJournal article
dc.contributor.imecauthorPoortmans, Jef
dc.contributor.imecauthorCaymax, Matty
dc.contributor.orcidimecPoortmans, Jef::0000-0003-2077-2545
dc.source.peerreviewno
dc.source.beginpage487
dc.source.endpage494
dc.source.journalIEEE Transactions on Nuclear Science
dc.source.issue3
dc.source.volume41
imec.availabilityPublished - imec


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