dc.contributor.author | Chen, Shih-Hung | |
dc.contributor.author | Hellings, Geert | |
dc.contributor.author | Linten, Dimitri | |
dc.contributor.author | Chiarella, Thomas | |
dc.contributor.author | Mertens, Hans | |
dc.contributor.author | Boschke, Roman | |
dc.contributor.author | Mitard, Jerome | |
dc.contributor.author | Kubicek, Stefan | |
dc.contributor.author | Ritzenthaler, Romain | |
dc.contributor.author | Bury, Erik | |
dc.contributor.author | Wang, Nian | |
dc.contributor.author | Groeseneken, Guido | |
dc.contributor.author | Mocuta, Anda | |
dc.contributor.author | Horiguchi, Naoto | |
dc.date.accessioned | 2021-10-24T03:25:41Z | |
dc.date.available | 2021-10-24T03:25:41Z | |
dc.date.issued | 2017 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/28015 | |
dc.source | IIOimport | |
dc.title | Towards optimal ESD diodes in next generation bulk FinFET and GAA NW technology nodes | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Chen, Shih-Hung | |
dc.contributor.imecauthor | Hellings, Geert | |
dc.contributor.imecauthor | Linten, Dimitri | |
dc.contributor.imecauthor | Chiarella, Thomas | |
dc.contributor.imecauthor | Mertens, Hans | |
dc.contributor.imecauthor | Mitard, Jerome | |
dc.contributor.imecauthor | Kubicek, Stefan | |
dc.contributor.imecauthor | Ritzenthaler, Romain | |
dc.contributor.imecauthor | Bury, Erik | |
dc.contributor.imecauthor | Groeseneken, Guido | |
dc.contributor.imecauthor | Horiguchi, Naoto | |
dc.contributor.orcidimec | Hellings, Geert::0000-0002-5376-2119 | |
dc.contributor.orcidimec | Linten, Dimitri::0000-0001-8434-1838 | |
dc.contributor.orcidimec | Chiarella, Thomas::0000-0002-6155-9030 | |
dc.contributor.orcidimec | Mitard, Jerome::0000-0002-7422-079X | |
dc.contributor.orcidimec | Ritzenthaler, Romain::0000-0002-8615-3272 | |
dc.contributor.orcidimec | Bury, Erik::0000-0002-5847-3949 | |
dc.contributor.orcidimec | Groeseneken, Guido::0000-0003-3763-2098 | |
dc.contributor.orcidimec | Horiguchi, Naoto::0000-0001-5490-0416 | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 171 | |
dc.source.endpage | 174 | |
dc.source.conference | IEEE International Electron Devices Meeting - IEDM | |
dc.source.conferencedate | 2/12/2017 | |
dc.source.conferencelocation | San Francisco, CA USA | |
dc.identifier.url | http://ieeexplore.ieee.org/document/8268346/ | |
imec.availability | Published - open access | |