dc.contributor.author | Chen, Zhe | |
dc.contributor.author | Belmonte, Attilio | |
dc.contributor.author | Chen, Michael | |
dc.contributor.author | Radhakrishnan, Janaki | |
dc.contributor.author | Redolfi, Augusto | |
dc.contributor.author | Kang, J. | |
dc.contributor.author | Goux, Ludovic | |
dc.contributor.author | Kar, Gouri Sankar | |
dc.date.accessioned | 2021-10-24T03:26:48Z | |
dc.date.available | 2021-10-24T03:26:48Z | |
dc.date.issued | 2017 | |
dc.identifier.issn | 0167-9317 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/28021 | |
dc.source | IIOimport | |
dc.title | Impact of tungsten oxidation conditions on the performance of Al2O3/WOx-based CBRAM devices | |
dc.type | Journal article | |
dc.contributor.imecauthor | Belmonte, Attilio | |
dc.contributor.imecauthor | Radhakrishnan, Janaki | |
dc.contributor.imecauthor | Redolfi, Augusto | |
dc.contributor.imecauthor | Goux, Ludovic | |
dc.contributor.imecauthor | Kar, Gouri Sankar | |
dc.contributor.orcidimec | Goux, Ludovic::0000-0002-1276-2278 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 56 | |
dc.source.endpage | 59 | |
dc.source.journal | Microelectronic Engineering | |
dc.source.volume | 178 | |
dc.identifier.url | http://www.sciencedirect.com/science/article/pii/S0167931717301612 | |
imec.availability | Published - imec | |