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Impact of tungsten oxidation conditions on the performance of Al2O3/WOx-based CBRAM devices
Publication:
Impact of tungsten oxidation conditions on the performance of Al2O3/WOx-based CBRAM devices
Date
2017
Journal article
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Chen, Zhe
;
Belmonte, Attilio
;
Chen, Michael
;
Radhakrishnan, Janaki
;
Redolfi, Augusto
;
Kang, J.
;
Goux, Ludovic
;
Kar, Gouri Sankar
Journal
Microelectronic Engineering
Abstract
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1863
since deposited on 2021-10-24
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Acq. date: 2025-10-25
Citations
Metrics
Views
1863
since deposited on 2021-10-24
425
item.page.metrics.field.last-week
Acq. date: 2025-10-25
Citations