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Impact of tungsten oxidation conditions on the performance of Al2O3/WOx-based CBRAM devices
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Impact of tungsten oxidation conditions on the performance of Al2O3/WOx-based CBRAM devices
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Date
2017
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Chen, Zhe
;
Belmonte, Attilio
;
Chen, Michael
;
Radhakrishnan, Janaki
;
Redolfi, Augusto
;
Kang, J.
;
Goux, Ludovic
;
Kar, Gouri Sankar
Journal
Microelectronic Engineering
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1864
since deposited on 2021-10-24
Acq. date: 2025-12-11
Citations
Metrics
Views
1864
since deposited on 2021-10-24
Acq. date: 2025-12-11
Citations