dc.contributor.author | Nigam, Tanya | |
dc.contributor.author | Degraeve, Robin | |
dc.contributor.author | Groeseneken, Guido | |
dc.contributor.author | Heyns, Marc | |
dc.contributor.author | Maes, Herman | |
dc.date.accessioned | 2021-10-01T08:33:43Z | |
dc.date.available | 2021-10-01T08:33:43Z | |
dc.date.issued | 1998 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/2806 | |
dc.source | IIOimport | |
dc.title | Constant current charge-to-breakdown: still a valid tool to study the reliability of MOS structures | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Degraeve, Robin | |
dc.contributor.imecauthor | Groeseneken, Guido | |
dc.contributor.imecauthor | Heyns, Marc | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | no | |
dc.source.beginpage | 62 | |
dc.source.endpage | 69 | |
dc.source.conference | Proceedings International Reliability Physics Symposium - IRPS | |
dc.source.conferencedate | 30/03/1998 | |
dc.source.conferencelocation | Reno, NV USA | |
imec.availability | Published - open access | |