Latchup in bulk finFET technology

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Authors
Dai, Chia Tsen; Chen, Shih-Hung; Linten, Dimitri; Scholz, Mirko; Hellings, Geert; Boschke, Roman; Karp, J.; Hart, M.; Groeseneken, Guido; Ker, Ming-Dou; Mocuta, Anda; Horiguchi, Naoto
Conference
IEEE International Reliability Physics Symposium - IRPS
Title
Latchup in bulk finFET technology
Publication type
Proceedings paper
Embargo date
9999-12-31
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