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Insights into the reliability of Ni/Cu plated p-PERC silicon solar cells

dc.contributor.authorDang Thi Thuy, Chi
dc.contributor.authorLabie, Riet
dc.contributor.authorSimoen, Eddy
dc.contributor.authorTous, Loic
dc.contributor.authorRussell, Richard
dc.contributor.authorDuerinckx, Filip
dc.contributor.authorMertens, Robert
dc.contributor.authorPoortmans, Jef
dc.date.accessioned2021-10-24T03:40:51Z
dc.date.available2021-10-24T03:40:51Z
dc.date.issued2017
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/28090
dc.sourceIIOimport
dc.titleInsights into the reliability of Ni/Cu plated p-PERC silicon solar cells
dc.typeProceedings paper
dc.contributor.imecauthorDang Thi Thuy, Chi
dc.contributor.imecauthorLabie, Riet
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.imecauthorTous, Loic
dc.contributor.imecauthorDuerinckx, Filip
dc.contributor.imecauthorMertens, Robert
dc.contributor.imecauthorPoortmans, Jef
dc.contributor.orcidimecLabie, Riet::0000-0002-1401-1291
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.contributor.orcidimecTous, Loic::0000-0001-9928-7774
dc.contributor.orcidimecDuerinckx, Filip::0000-0003-2570-7371
dc.contributor.orcidimecPoortmans, Jef::0000-0003-2077-2545
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage862
dc.source.endpage868
dc.source.conference7th International Conference on Silicon Photovoltaics - SiliconPV
dc.source.conferencedate3/04/2017
dc.source.conferencelocationFreiburg Germany
dc.identifier.urlhttp://www.sciencedirect.com/science/article/pii/S1876610217341668
imec.availabilityPublished - open access
imec.internalnotesEnergy Procedia; Vol. 124


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