Show simple item record

Optimized statistical test for event detection in NILM

dc.contributor.authorDe Baets, Leen
dc.contributor.authorRuyssinck, Joeri
dc.contributor.authorDevelder, Chris
dc.contributor.authorDhaene, Tom
dc.contributor.authorDeschrijver, Dirk
dc.date.accessioned2021-10-24T03:44:27Z
dc.date.available2021-10-24T03:44:27Z
dc.date.issued2017-06
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/28106
dc.sourceIIOimport
dc.titleOptimized statistical test for event detection in NILM
dc.typeProceedings paper
dc.contributor.imecauthorRuyssinck, Joeri
dc.contributor.imecauthorDevelder, Chris
dc.contributor.imecauthorDhaene, Tom
dc.contributor.imecauthorDeschrijver, Dirk
dc.contributor.orcidimecDevelder, Chris::0000-0003-2707-4176
dc.contributor.orcidimecDhaene, Tom::0000-0003-2899-4636
dc.contributor.orcidimecDeschrijver, Dirk::0000-0001-6600-1792
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage1
dc.source.endpage5
dc.source.conferenceIEEE International Conference on Environment and Electrical Engineering and IEEE Industrial and Commerce - EEEIC/I&CPS Europe
dc.source.conferencedate6/06/2017
dc.source.conferencelocationMilano Italy
imec.availabilityPublished - open access
imec.internalnotesISBN 978-1-5386-3917-7


Files in this item

Thumbnail
Name:
37177.pdf
Size:
434.8Kb
Format:
PDF
View/open

This item appears in the following collection(s)

Show simple item record