Framework for automated tests of LTE physical layers

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Authors
de Figueiredo, F.A.P.; Mathilde, F.; Pizzini, L.R.; Figueiredo, F.; Carillo, D.; Moerman, Ingrid
Conference
XXIV International Congress of Electrical Engineering, Electronics and Computing
Title
Framework for automated tests of LTE physical layers
Publication type
Proceedings paper
Embargo date
9999-12-31
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