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Test vehicle for electromigration testing of 3D IC

dc.contributor.authorDe Messemaeker, Joke
dc.contributor.authorStucchi, Michele
dc.contributor.authorCroes, Kristof
dc.date.accessioned2021-10-24T03:51:31Z
dc.date.available2021-10-24T03:51:31Z
dc.date.issued2017
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/28138
dc.sourceIIOimport
dc.titleTest vehicle for electromigration testing of 3D IC
dc.typeOral presentation
dc.contributor.imecauthorDe Messemaeker, Joke
dc.contributor.imecauthorStucchi, Michele
dc.contributor.imecauthorCroes, Kristof
dc.contributor.orcidimecCroes, Kristof::0000-0002-3955-0638
dc.source.peerreviewno
dc.source.conference5th European Expert Workshop on Reliability of Electronics and Smart Systems - EuWoRel
dc.source.conferencedate26/09/2017
dc.source.conferencelocationBerlin Germany
imec.availabilityPublished - imec


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