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Parametric test for next generation semiconductor technologies

dc.contributor.authorDe Wachter, Bart
dc.contributor.authorMarinissen, Erik Jan
dc.contributor.authorFodor, Ferenc
dc.contributor.authorHiblot, Gaspard
dc.date.accessioned2021-10-24T04:00:45Z
dc.date.available2021-10-24T04:00:45Z
dc.date.issued2017
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/28177
dc.sourceIIOimport
dc.titleParametric test for next generation semiconductor technologies
dc.typeMeeting abstract
dc.contributor.imecauthorDe Wachter, Bart
dc.contributor.imecauthorMarinissen, Erik Jan
dc.contributor.imecauthorFodor, Ferenc
dc.contributor.imecauthorHiblot, Gaspard
dc.contributor.orcidimecMarinissen, Erik Jan::0000-0002-5058-8303
dc.contributor.orcidimecHiblot, Gaspard::0000-0002-3869-965X
dc.source.peerreviewno
dc.source.conferenceSemiconductor Test Summit - NIWeek
dc.source.conferencedate22/05/2017
dc.source.conferencelocationAustin, TX USA
imec.availabilityPublished - imec


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