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Radiation source dependence of degradation in MOSFETs on SIMOX substrate

dc.contributor.authorOhyama, Hidenori
dc.contributor.authorHakata, T.
dc.contributor.authorSimoen, Eddy
dc.contributor.authorClaeys, Cor
dc.contributor.authorTakami, Y.
dc.contributor.authorKawamura, K.
dc.contributor.authorMiyahara, K.
dc.contributor.authorHosashima, M.
dc.date.accessioned2021-10-01T08:35:25Z
dc.date.available2021-10-01T08:35:25Z
dc.date.issued1998
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/2821
dc.sourceIIOimport
dc.titleRadiation source dependence of degradation in MOSFETs on SIMOX substrate
dc.typeProceedings paper
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.source.peerreviewno
dc.source.beginpage387
dc.source.endpage392
dc.source.conferenceSemiconductors for Room-Temperature Radiation Detector Applications II;
dc.source.conferencelocation
imec.availabilityPublished - imec


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