The impact of the Ge content on the characteristics of strained Si1-xGex epitaxial diodes before and after degradation by high energy particles

Publication:

1998

Proceedings Paper

Author(s)

Ohyama, Hidenori

;

Simoen, Eddy

;

Claeys, Cor

;

Takami, Y.

;

Hayama, Kiyoteru

;

Hakata, T.

;

Kobayashi, K.

;

Sunaga, H.

;

Poortmans, Jef

;

Caymax, Matty

1861 since deposited on 2021-10-01

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Acq. date: 2026-10-08