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Development and reference-free characterization of 3D nanostructures as potential calibration sample for analytical techniques

dc.contributor.authorDialameh, Masoud
dc.contributor.authorFerrarese Lupi, Federico
dc.contributor.authorDe Leo, Natascia
dc.contributor.authorBoarino, Luca
dc.contributor.authorHönicke, Philipp
dc.contributor.authorKayser, Yves
dc.contributor.authorBeckhoff, Burkhard
dc.contributor.authorWeimann, Thomas
dc.contributor.authorFleischmann, Claudia
dc.contributor.authorVandervorst, Wilfried
dc.date.accessioned2021-10-24T04:19:12Z
dc.date.available2021-10-24T04:19:12Z
dc.date.issued2017
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/28249
dc.sourceIIOimport
dc.titleDevelopment and reference-free characterization of 3D nanostructures as potential calibration sample for analytical techniques
dc.typeOral presentation
dc.contributor.imecauthorFleischmann, Claudia
dc.contributor.imecauthorVandervorst, Wilfried
dc.contributor.orcidimecFleischmann, Claudia::0000-0003-1531-6916
dc.source.peerreviewno
dc.source.conferenceE-MRS Spring Meeting Symposium on Analytical Techniques for Precise Characterization of Nano Materials - ALTECH
dc.source.conferencedate22/05/2017
dc.source.conferencelocationStrasbourg France
dc.identifier.urlhttp://www.european-mrs.com/altech-2017-analytical-techniques-precise-characterization-nano-materials-emrs
imec.availabilityPublished - imec
imec.internalnotesS.10-P.20


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