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Radiation source dependence of degradation and recovery of irradiated In0.53Ga0.47As PIN photodiodes

dc.contributor.authorOhyama, Hidenori
dc.contributor.authorSimoen, Eddy
dc.contributor.authorClaeys, Cor
dc.contributor.authorTakami, Y.
dc.contributor.authorKudou, T.
dc.contributor.authorSunaga, H.
dc.date.accessioned2021-10-01T08:36:05Z
dc.date.available2021-10-01T08:36:05Z
dc.date.issued1998
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/2826
dc.sourceIIOimport
dc.titleRadiation source dependence of degradation and recovery of irradiated In0.53Ga0.47As PIN photodiodes
dc.typeProceedings paper
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage108
dc.source.endpage113
dc.source.conferenceProceedings 4th European Conference on Radiation and its Effects on Components and Systems - RADECS
dc.source.conferencedate15/09/1998
dc.source.conferencelocationCannes France
imec.availabilityPublished - open access


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