Show simple item record

Exploiting reflectional and rotational invariance in single image superresolution

dc.contributor.authorDonné, Simon
dc.contributor.authorMeeus, Laurens
dc.contributor.authorLuong, Hiep
dc.contributor.authorGoossens, Bart
dc.contributor.authorPhilips, Wilfried
dc.date.accessioned2021-10-24T04:25:26Z
dc.date.available2021-10-24T04:25:26Z
dc.date.issued2017
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/28272
dc.sourceIIOimport
dc.titleExploiting reflectional and rotational invariance in single image superresolution
dc.typeProceedings paper
dc.contributor.imecauthorMeeus, Laurens
dc.contributor.imecauthorLuong, Hiep
dc.contributor.imecauthorGoossens, Bart
dc.contributor.imecauthorPhilips, Wilfried
dc.contributor.orcidimecLuong, Hiep::0000-0002-6246-5538
dc.contributor.orcidimecGoossens, Bart::0000-0002-1666-5483
dc.contributor.orcidimecPhilips, Wilfried::0000-0003-4456-4353
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage1043
dc.source.endpage1049
dc.source.conference30th IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops
dc.source.conferencedate21/07/2017
dc.source.conferencelocationHonolulu, HI Hawaii
dc.identifier.urlhttps://ieeexplore.ieee.org/document/8014875
imec.availabilityPublished - open access


Files in this item

Thumbnail
Name:
40141.pdf
Size:
592.7Kb
Format:
PDF
View/open

This item appears in the following collection(s)

Show simple item record