Radiation damage of In0.53Ga0.47As photodiodes by high energy particles
dc.contributor.author | Ohyama, Hidenori | |
dc.contributor.author | Simoen, Eddy | |
dc.contributor.author | Claeys, Cor | |
dc.contributor.author | Takami, Y. | |
dc.contributor.author | Kudou, T. | |
dc.contributor.author | Sunaga, H. | |
dc.date.accessioned | 2021-10-01T08:36:12Z | |
dc.date.available | 2021-10-01T08:36:12Z | |
dc.date.issued | 1998 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/2827 | |
dc.source | IIOimport | |
dc.title | Radiation damage of In0.53Ga0.47As photodiodes by high energy particles | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Simoen, Eddy | |
dc.contributor.orcidimec | Simoen, Eddy::0000-0002-5218-4046 | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | no | |
dc.source.beginpage | 116 | |
dc.source.endpage | 123 | |
dc.source.conference | 2nd International Conference on Materials for Microelectronics - ICMM | |
dc.source.conferencedate | 14/09/1998 | |
dc.source.conferencelocation | Bordeaux France | |
imec.availability | Published - open access |