Show simple item record

Single defect discharge events in vertical-nanowire tunnel-FETs

dc.contributor.authorFiore, Anonio
dc.contributor.authorFranco, Jacopo
dc.contributor.authorCho, Moon Ju
dc.contributor.authorCrupi, Felice
dc.contributor.authorStrangio, Sebastiano
dc.contributor.authorRoussel, Philippe
dc.contributor.authorRooyackers, Rita
dc.contributor.authorCollaert, Nadine
dc.contributor.authorLinten, Dimitri
dc.date.accessioned2021-10-24T04:43:39Z
dc.date.available2021-10-24T04:43:39Z
dc.date.issued2017
dc.identifier.issn1530-4388
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/28334
dc.sourceIIOimport
dc.titleSingle defect discharge events in vertical-nanowire tunnel-FETs
dc.typeJournal article
dc.contributor.imecauthorFranco, Jacopo
dc.contributor.imecauthorRoussel, Philippe
dc.contributor.imecauthorCollaert, Nadine
dc.contributor.imecauthorLinten, Dimitri
dc.contributor.orcidimecFranco, Jacopo::0000-0002-7382-8605
dc.contributor.orcidimecRoussel, Philippe::0000-0002-0402-8225
dc.contributor.orcidimecCollaert, Nadine::0000-0002-8062-3165
dc.contributor.orcidimecLinten, Dimitri::0000-0001-8434-1838
dc.source.peerreviewyes
dc.source.beginpage253
dc.source.endpage258
dc.source.journalIEEE Transactions on Device and Materials Reliability
dc.source.issue1
dc.source.volume17
dc.identifier.urlhttp://ieeexplore.ieee.org/document/7828004/
imec.availabilityPublished - imec


Files in this item

FilesSizeFormatView

There are no files associated with this item.

This item appears in the following collection(s)

Show simple item record