Single defect discharge events in vertical-nanowire tunnel-FETs

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Authors

Fiore, Anonio; Franco, Jacopo; Cho, Moon Ju; Crupi, Felice; Strangio, Sebastiano; Roussel, Philippe; Rooyackers, Rita; Collaert, Nadine; Linten, Dimitri

ISSN

1530-4388

Issue

1

Journal

IEEE Transactions on Device and Materials Reliability

Volume

17

Title

Single defect discharge events in vertical-nanowire tunnel-FETs

Publication type

Journal article

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