Publication:

Single defect discharge events in vertical-nanowire tunnel-FETs

Date

2017

Journal article

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Author(s)

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Strangio, Sebastiano

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Roussel, Philippe

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Rooyackers, Rita

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Collaert, Nadine

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Linten, Dimitri

Journal

IEEE Transactions on Device and Materials Reliability

Statistics

1867 since deposited on 2021-10-24

Acq. date: 2026-02-24