Single defect discharge events in vertical-nanowire tunnel-FETs

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Author(s)

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Strangio, Sebastiano

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Roussel, Philippe

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Rooyackers, Rita

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Collaert, Nadine

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Linten, Dimitri

Journal

IEEE Transactions on Device and Materials Reliability

Metrics

1866 since deposited on 2021-10-24

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Acq. date: 2025-11-01