Single defect discharge events in vertical-nanowire tunnel-FETs

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Author(s)

Fiore, Anonio

;

;

Cho, Moon Ju

;

Crupi, Felice

;

Strangio, Sebastiano

;

Roussel, Philippe

;

Rooyackers, Rita

;

Collaert, Nadine

;

Linten, Dimitri

Journal

IEEE Transactions on Device and Materials Reliability

Metrics

1865 since deposited on 2021-10-24

Acq. date: 2025-10-29