Publication:

Single defect discharge events in vertical-nanowire tunnel-FETs

Date

2017
Journal article
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dc.contributor.authorFiore, Anonio
dc.contributor.authorFranco, Jacopo
dc.contributor.authorCho, Moon Ju
dc.contributor.authorCrupi, Felice
dc.contributor.authorStrangio, Sebastiano
dc.contributor.authorRoussel, Philippe
dc.contributor.authorRooyackers, Rita
dc.contributor.authorCollaert, Nadine
dc.contributor.authorLinten, Dimitri
dc.contributor.imecauthorFranco, Jacopo
dc.contributor.imecauthorRoussel, Philippe
dc.contributor.imecauthorCollaert, Nadine
dc.contributor.imecauthorLinten, Dimitri
dc.contributor.orcidimecFranco, Jacopo::0000-0002-7382-8605
dc.contributor.orcidimecRoussel, Philippe::0000-0002-0402-8225
dc.contributor.orcidimecCollaert, Nadine::0000-0002-8062-3165
dc.contributor.orcidimecLinten, Dimitri::0000-0001-8434-1838
dc.date.accessioned2021-10-24T04:43:39Z
dc.date.available2021-10-24T04:43:39Z
dc.date.issued2017
dc.identifier.issn1530-4388
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/28334
dc.identifier.urlhttp://ieeexplore.ieee.org/document/7828004/
dc.source.beginpage253
dc.source.endpage258
dc.source.issue1
dc.source.journalIEEE Transactions on Device and Materials Reliability
dc.source.volume17
dc.title

Single defect discharge events in vertical-nanowire tunnel-FETs

dc.typeJournal article
dspace.entity.typePublication
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