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NBTI-generated defects in nanoscaled devices: fast characterization methodology and modeling

dc.contributor.authorGao, Rui
dc.contributor.authorJi, Zhigang
dc.contributor.authorManut, Azrif B.
dc.contributor.authorZhang, Jian Fu
dc.contributor.authorFranco, Jacopo
dc.contributor.authorHatta, Sharifah Wan Muhamad
dc.contributor.authorZhang, Wei Dong
dc.contributor.authorKaczer, Ben
dc.contributor.authorLinten, Dimitri
dc.contributor.authorGroeseneken, Guido
dc.date.accessioned2021-10-24T04:54:24Z
dc.date.available2021-10-24T04:54:24Z
dc.date.issued2017
dc.identifier.issn0018-9383
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/28367
dc.sourceIIOimport
dc.titleNBTI-generated defects in nanoscaled devices: fast characterization methodology and modeling
dc.typeJournal article
dc.contributor.imecauthorFranco, Jacopo
dc.contributor.imecauthorKaczer, Ben
dc.contributor.imecauthorLinten, Dimitri
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.orcidimecFranco, Jacopo::0000-0002-7382-8605
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.contributor.orcidimecLinten, Dimitri::0000-0001-8434-1838
dc.contributor.orcidimecGroeseneken, Guido::0000-0003-3763-2098
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage4011
dc.source.journalIEEE Transactions on Electron Devices
dc.source.issue10
dc.source.volume64
dc.identifier.urlhttp://ieeexplore.ieee.org/document/8030148/
imec.availabilityPublished - open access


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