Publication:

NBTI-generated defects in nanoscaled devices: fast characterization methodology and modeling

Date

2017

Journal article

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Files

37884.pdf 3.2 MB

Author(s)

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Manut, Azrif B.

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Hatta, Sharifah Wan Muhamad

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Zhang, Wei Dong

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Linten, Dimitri

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Groeseneken, Guido

Journal

IEEE Transactions on Electron Devices

Metrics

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Acq. date: 2026-01-10