Publication:

NBTI-generated defects in nanoscaled devices: fast characterization methodology and modeling

Date

2017
Journal article
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dc.contributor.authorGao, Rui
dc.contributor.authorJi, Zhigang
dc.contributor.authorManut, Azrif B.
dc.contributor.authorZhang, Jian Fu
dc.contributor.authorFranco, Jacopo
dc.contributor.authorHatta, Sharifah Wan Muhamad
dc.contributor.authorZhang, Wei Dong
dc.contributor.authorKaczer, Ben
dc.contributor.authorLinten, Dimitri
dc.contributor.authorGroeseneken, Guido
dc.contributor.imecauthorFranco, Jacopo
dc.contributor.imecauthorKaczer, Ben
dc.contributor.imecauthorLinten, Dimitri
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.orcidimecFranco, Jacopo::0000-0002-7382-8605
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.contributor.orcidimecLinten, Dimitri::0000-0001-8434-1838
dc.contributor.orcidimecGroeseneken, Guido::0000-0003-3763-2098
dc.date.accessioned2021-10-24T04:54:24Z
dc.date.available2021-10-24T04:54:24Z
dc.date.embargo9999-12-31
dc.date.issued2017
dc.identifier.issn0018-9383
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/28367
dc.identifier.urlhttp://ieeexplore.ieee.org/document/8030148/
dc.source.beginpage4011
dc.source.issue10
dc.source.journalIEEE Transactions on Electron Devices
dc.source.volume64
dc.title

NBTI-generated defects in nanoscaled devices: fast characterization methodology and modeling

dc.typeJournal article
dspace.entity.typePublication
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