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Testing for internal defects in library cells

dc.contributor.authorGao, Zhan
dc.contributor.authorJiao, Hailong
dc.contributor.authorHuisken, Jos
dc.contributor.authorMarinissen, Erik Jan
dc.contributor.authorChickermane, Vivek
dc.contributor.authorSwenton, Joe
dc.contributor.authorWisnesky, Carl
dc.contributor.authorGoossens, Kees
dc.date.accessioned2021-10-24T04:55:28Z
dc.date.available2021-10-24T04:55:28Z
dc.date.issued2017-05
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/28370
dc.sourceIIOimport
dc.titleTesting for internal defects in library cells
dc.typeProceedings paper
dc.contributor.imecauthorGao, Zhan
dc.contributor.imecauthorMarinissen, Erik Jan
dc.contributor.orcidimecMarinissen, Erik Jan::0000-0002-5058-8303
dc.source.peerreviewyes
dc.source.conferenceICT.OPEN
dc.source.conferencedate21/03/2017
dc.source.conferencelocationAmersfoort the Netherlands
imec.availabilityPublished - imec


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