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Atom-counting in High Resolution Electron Microscopy: TEM or STEM – That's the question

dc.contributor.authorGonnissen, J.
dc.contributor.authorDe Backer, A.
dc.contributor.authorden Dekker, A.J.
dc.contributor.authorSijbers, Jan
dc.contributor.authorVan Aert, S.
dc.date.accessioned2021-10-24T05:08:08Z
dc.date.available2021-10-24T05:08:08Z
dc.date.issued2017-03
dc.identifier.issn0304-3991
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/28408
dc.sourceIIOimport
dc.titleAtom-counting in High Resolution Electron Microscopy: TEM or STEM – That's the question
dc.typeJournal article
dc.contributor.imecauthorSijbers, Jan
dc.contributor.orcidimecSijbers, Jan::0000-0003-4225-2487
dc.source.peerreviewyes
dc.source.beginpage112
dc.source.endpage120
dc.source.journalUltramicroscopy
dc.source.volume174
dc.identifier.urlhttps://www.sciencedirect.com/science/article/pii/S0304399116302807?via%3Dihub
imec.availabilityPublished - imec


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