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Extended qualification testing of 1-cell crystalline Si PV laminates: impacts of advanced cell metallization and encapsulation schemes

dc.contributor.authorGovaerts, Jonathan
dc.contributor.authorGeyer, Bert
dc.contributor.authorvan der Heide, Arvid
dc.contributor.authorBorgers, Tom
dc.contributor.authorHellstrom, Stefan
dc.contributor.authorBroeders, Bert
dc.contributor.authorVoroshazi, Eszter
dc.contributor.authorSzlufcik, Jozef
dc.contributor.authorPoortmans, Jef
dc.date.accessioned2021-10-24T05:10:31Z
dc.date.available2021-10-24T05:10:31Z
dc.date.issued2017-09
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/28415
dc.sourceIIOimport
dc.titleExtended qualification testing of 1-cell crystalline Si PV laminates: impacts of advanced cell metallization and encapsulation schemes
dc.typeProceedings paper
dc.contributor.imecauthorGovaerts, Jonathan
dc.contributor.imecauthorvan der Heide, Arvid
dc.contributor.imecauthorBorgers, Tom
dc.contributor.imecauthorVoroshazi, Eszter
dc.contributor.imecauthorSzlufcik, Jozef
dc.contributor.imecauthorPoortmans, Jef
dc.contributor.orcidimecGovaerts, Jonathan::0000-0002-8908-1198
dc.contributor.orcidimecvan der Heide, Arvid::0000-0002-7589-4526
dc.contributor.orcidimecBorgers, Tom::0000-0002-7878-6977
dc.contributor.orcidimecPoortmans, Jef::0000-0003-2077-2545
dc.source.peerreviewyes
dc.source.beginpage1332
dc.source.endpage1335
dc.source.conference33rd European Photovoltaics Science and Engineering Conference - EUPVSEC
dc.source.conferencedate25/09/2017
dc.source.conferencelocationAmsterdam The Netherlands
imec.availabilityPublished - imec


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