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Improving pH sensing by nanoscaling the width of CMOS technology compatible FinFETs

dc.contributor.authorGupta, Mihir
dc.contributor.authorVeloso, Anabela
dc.contributor.authorTao, Zheng
dc.contributor.authorLi, Waikin
dc.contributor.authorPeumans, Peter
dc.contributor.authorVan Roy, Wim
dc.contributor.authorMartens, Koen
dc.contributor.authorLagae, Liesbet
dc.date.accessioned2021-10-24T05:18:14Z
dc.date.available2021-10-24T05:18:14Z
dc.date.issued2017
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/28436
dc.sourceIIOimport
dc.titleImproving pH sensing by nanoscaling the width of CMOS technology compatible FinFETs
dc.typeMeeting abstract
dc.contributor.imecauthorGupta, Mihir
dc.contributor.imecauthorVeloso, Anabela
dc.contributor.imecauthorTao, Zheng
dc.contributor.imecauthorLi, Waikin
dc.contributor.imecauthorPeumans, Peter
dc.contributor.imecauthorVan Roy, Wim
dc.contributor.imecauthorMartens, Koen
dc.contributor.imecauthorLagae, Liesbet
dc.contributor.orcidimecGupta, Mihir::0000-0003-0286-7997
dc.contributor.orcidimecVan Roy, Wim::0000-0003-3232-1987
dc.contributor.orcidimecMartens, Koen::0000-0001-7135-5536
dc.source.peerreviewyes
dc.source.beginpage3.3
dc.source.conferenceIEEE Semiconductor Interface Specialists Conference - SISC
dc.source.conferencedate6/12/2017
dc.source.conferencelocationSan Diego, CA USA
dc.identifier.urlhttp://www.ieeesisc.org/programs/2017_SISC_technical_program.pdf
imec.availabilityPublished - imec


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