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SRAM enablement beyond N7: a BTI study

dc.contributor.authorGupta, Mohit
dc.contributor.authorWeckx, Pieter
dc.contributor.authorCosemans, Stefan
dc.contributor.authorSchuddinck, Pieter
dc.contributor.authorBaert, Rogier
dc.contributor.authorJang, Doyoung
dc.contributor.authorSherazi, Yasser
dc.contributor.authorRaghavan, Praveen
dc.contributor.authorKaczer, Ben
dc.contributor.authorSpessot, Alessio
dc.contributor.authorMocuta, Anda
dc.contributor.authorDehaene, Wim
dc.date.accessioned2021-10-24T05:18:39Z
dc.date.available2021-10-24T05:18:39Z
dc.date.issued2017
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/28437
dc.sourceIIOimport
dc.titleSRAM enablement beyond N7: a BTI study
dc.typeProceedings paper
dc.contributor.imecauthorGupta, Mohit
dc.contributor.imecauthorWeckx, Pieter
dc.contributor.imecauthorCosemans, Stefan
dc.contributor.imecauthorSchuddinck, Pieter
dc.contributor.imecauthorBaert, Rogier
dc.contributor.imecauthorJang, Doyoung
dc.contributor.imecauthorSherazi, Yasser
dc.contributor.imecauthorKaczer, Ben
dc.contributor.imecauthorSpessot, Alessio
dc.contributor.imecauthorDehaene, Wim
dc.contributor.orcidimecGupta, Mohit::0000-0002-1924-1264
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpageCR-4.1
dc.source.endpageCR-4.6
dc.source.conferenceIEEE International Reliability Physics Sysmposium - IRPS
dc.source.conferencedate2/04/2017
dc.source.conferencelocationMonterey, CA USA
dc.identifier.urlhttp://ieeexplore.ieee.org/document/7936353/
imec.availabilityPublished - open access


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