dc.contributor.author | He, Liang | |
dc.contributor.author | Simoen, Eddy | |
dc.contributor.author | Claeys, Cor | |
dc.contributor.author | Wang, Guilei | |
dc.contributor.author | Luo, Jun | |
dc.contributor.author | Zhao, Chao | |
dc.contributor.author | Li, Junfeng | |
dc.contributor.author | Chen, Hua | |
dc.contributor.author | Hu, Yin | |
dc.contributor.author | Qin, Xiaoting | |
dc.date.accessioned | 2021-10-24T05:32:57Z | |
dc.date.available | 2021-10-24T05:32:57Z | |
dc.date.issued | 2017 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/28476 | |
dc.source | IIOimport | |
dc.title | Low frequency noise characterization of 22nm PMOS featuring with filling W gate using different precursors | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Simoen, Eddy | |
dc.contributor.orcidimec | Simoen, Eddy::0000-0002-5218-4046 | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | yes | |
dc.source.conference | China Semiconductor Technology International Conference - CSTIC | |
dc.source.conferencedate | 12/03/2017 | |
dc.source.conferencelocation | Shanghai China | |
dc.identifier.url | https://ieeexplore.ieee.org/document/7919856/ | |
imec.availability | Published - open access | |