Characterization and modelling of growth-induced defects in InGaAs by MOCVD

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Authors
Hsu, Brent; Simoen, Eddy; Eneman, Geert; Alian, AliReza; Mols, Yves; Heyns, Marc
Conference
E-MRS
Title
Characterization and modelling of growth-induced defects in InGaAs by MOCVD
Publication type
Meeting abstract
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